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GB/T 45459-2025_Chinese: Microbeam analysis - Focused ion beam - Preparation of TEM specimens (Chinese: 微束分析 聚焦离子束 透射电镜试样制备方法) Note/Careful: Text of PDF is in Chinese (not English). Delivery (PDF in Chinese): 2 working-hours typically, ASAP English versions: GB/T 45459-2025
