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GB/T 4937.35-2024 Chinese PDF (GB/T4937.35-2024)

GB/T 4937.35-2024 Chinese PDF (GB/T4937.35-2024)

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GB/T 4937.35-2024_Chinese: Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (Chinese: 半导体器件 机械和气候试验方法 第35部分：塑封电子元器件的声学显微镜检查)
Note/Careful: Text of PDF is in Chinese (not English).
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English versions: GB/T 4937.35-2024
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